Pre-Enrollment

8th November 2026

Final Paper Submission

13th November 2026

Registration Deadline

23rd November`2026

Conference Date

8th Dec - 9th Dec 2026

Call for Papers

The International Conference on Deep Learning for Image-Based Defect Detection invites researchers, academicians, industry experts, and practitioners to submit original and high-quality research contributions. This conference serves as a global platform for presenting innovative ideas, exchanging knowledge, and fostering interdisciplinary collaboration.

Focusing on key research areas such as Data Science, the conference aims to bridge theoretical advancements with real-world applications.

Authors are invited to submit papers addressing, but not limited to, the following areas:

01
Deep Learning Techniques For Defect Detection
02
Image Processing In Quality Control
03
Data Augmentation For Defect Recognition
04
Real-time Defect Detection Systems
05
Machine Learning For Image Classification
06
Data-driven Approaches To Defect Analysis
07
Computer Vision Applications In Manufacturing
08
Predictive Analytics For Defect Prevention
09
Quality Assurance Using Deep Learning
10
Data Ethics In Image-based Detection
11
Automated Inspection Systems And Data
12
Data Visualization For Defect Analysis
13
Collaborative Robots In Defect Detection
14
Impact Of Ai On Manufacturing Quality
15
Future Trends In Defect Detection Technologies
16
Data Management For Image Datasets
17
User Engagement Through Defect Analytics
18
Deep Learning Model Optimization Techniques
19
Data-driven Insights For Manufacturing Defects
20
Integration Of Iot In Defect Detection
Conference Registration

To confirm your participation and secure your presentation slot, authors of accepted papers must complete the registration. Early registration is highly recommended to enjoy discounted fees.

Register Now to Confirm Participation
Publication & Submission

Present your findings to a global audience. All accepted papers are eligible for publication in ISER-affiliated journals and conference proceedings, providing you with maximum academic visibility.

Submit Your Paper for Review